A 12-inch wafer fab encountered batch yield fluctuations during mass production of the 28nm process.Through the introduction of Hai Ruisi's comprehensive detection solution, nanoscale leaks were found in the gas delivery pipeline of the etching equipment.After the problem was solved, the product yield rate stabilized at more than 99.2%, avoiding losses of more than 20 million yuan every year, and successfully passed the certification audit of top international customers.

Relying on our profound technological accumulation in the field of sealing inspection in wafer manufacturing, we have provided professional solutions for many advanced wafer fabs.Welcome to contact us to get a customized testing solution for your production line.